1. Introduction
2. Quantum fault-tolerant threshold
Figure 1. Quantum circuits with fault-tolerant gates under correlated errors. (a) The non-encoded H2 circuit. (b) The non-encoded CNOT21 · H2 circuit. (c) The complete encoded quantum fault-tolerant circuit under correlated errors. IM denotes ideal measurement. The two error gates linked by a double-headed arrow in the figure denote a correlated error pair. |
2.1. Logical operation H2 with correlated error gates
Figure 2. The p dependence of the fidelity difference Dp,μ with different μ under correlated bit flip noise. The lines from bottom to top correspond to μ = 0, 0.2, 0.4, 0.6, 0.8 and 1, respectively. The horizontal dash-dotted line indicates the fault-tolerance bound at Dp,μ = 0. The magnified view on the upper right displays the error thresholds with different μ. |
Figure 3. The p dependence of Dp,μ for logical H2 operation under (a) bit-phase flip noise and (b) phase flip noise. The lines from bottom to top correspond to μ = 0, 0.2, 0.4, 0.6, 0.8 and 1, respectively. |
2.2. Logical operation CNOT21 · H2 with correlated error gates
Figure 4. The p dependence of Dp,μ for the logical CNOT21 · H2 operation under correlated bit flip noise. The lines from bottom to top correspond to μ = 0, 0.2, 0.4, 0.6, 0.8 and 1, respectively. The magnified view on the upper right displays the error thresholds with different μ. |
Figure 5. Dp,μ versus p for the logical operation CNOT21 · H2 under (a) bit-phase flip noise and (b) phase flip noise. The solid red, orange, green, blue, purple, and black lines correspond to μ = 0, 0.2, 0.4, 0.6, 0.8 and 1, respectively. The fidelities Fp,μ and fp,μ versus p with μ = 0 and μ = 1 under (c) bit-phase flip noise and (d) phase flip noise. |
3. Quantum fault-tolerant threshold in teleportation
Figure 6. Fault-tolerant quantum circuits for teleportation. (a) The circuit for teleportation. (b) The non-encode circuit for teleportation with error gates. Input state and EPR pair are prepared from initial state ∣000〉. (c) The complete fault-tolerant encoded circuit for teleportation with correlated error gates. The pink error gates connected by arrows are correlated with each other. |
Figure 7. The p dependence of Dp for bit flip errors and bit-phase flip errors, respectively. Here, after the two-qubit gate operation, there is only a single error gate, which affects only the target qubit. The magnified view on the upper right displays the error thresholds. The lower-left panel shows the p dependence of the fidelities ${F}_{p}^{av}$ and ${f}_{p}^{av}$ under bit flip noise. |
Figure 8. Average fidelity difference Dp,μ between the fault-tolerant encoded and non-encoded circuits for bit-phase flip errors. The magnified view on the upper right displays the error threshold for various values of μ. The lower-left panel shows the fidelity decay of the non-encoded circuit under bit-phase flip noise for μ = 0 and 0.9. |


