Power law decay of stored pattern stability in sparse Hopfield neural networks

Fei Fang,Zhou Yang,Sheng-Jun Wang

Figure 6. The fraction R of flipped nodes. The fraction R is computed in a moving window of 500 nodes. The dashed line is the results obtained at the initial state. The solid line is the results obtained by comparing the signal and noisy term for each node in the simulation of updating process. The parameters are N=10 000, pattern number n=10 000, and average degree ⟨k⟩=50.